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Venue Details »
- 16th September 2020
4:00 pm - 5:00 pm
Date: 16 September 2020
Time: 4PM BST
Venue: Online
Among the different issues affecting the reliability of semiconductor components in critical systems, radiation effects have always been a concern. It plays a major role not only for spaceborne environments, but emerging applications in terrestrial environments as well.
In this webinar, we will present the susceptibility of integrated circuits (ICs) to two main radiation effects: total ionizing dose (TID) and single event effects (SEE).
We will then present reliability predictions using simulation methods from a perspective of design, process technology and environment.
Registration / Further Information
Simply choose one of the following options to receive further information or to register.
- Complete the form opposite
- Call us on +44 (0)161 474 6886
- Email us at events@WildeAnalysis.co.uk
Please note that this event is free to attend but registration is essential.
Location
Venue: Online
Address:
Online
Description:
Details on how to join the webinar will be emailed to you once registered.
In this webinar, we will present the susceptibility of integrated circuits (ICs) to two main radiation effects: total ionizing dose (TID) and single event effects (SEE).