Radiation Effects on Integrated Circuits | Ansys Webinar
- 16th September 2020
4:00 pm - 5:00 pm
Date: 16 September 2020
Time: 4PM BST
Registration / Further Information
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Please note that this event is free to attend but registration is essential.
Details on how to join the webinar will be emailed to you once registered.
In this webinar, we will present the susceptibility of integrated circuits (ICs) to two main radiation effects: total ionizing dose (TID) and single event effects (SEE).