Using the General Log-Linear Model in ALTA PRO for Thermal Cycling

June 21st, 2016

Reliability HotWire is a monthly eMagazine by ReliaSoft providing information and tips on how to best improve your reliability practices and get the most out of ReliaSoft’s tools for reliability and life data analysis.

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Using the General Log-Linear Model in ALTA PRO for Thermal Cycling

Having higher reliability than competitors is one of the key factors for success. This is especially true for the electronics industry. The reliability of electronic products can be predicted based on the design, the manufacturing process and the expected operating conditions. There are many different approaches for reliability estimation such as standards based reliability prediction, physics of failure and life testing. ReliaSoft’s ALTA PRO employs a physics of failure approach and can be used to analyse test data for single or multiple stress conditions. In this article, we will analyse accelerated test data using the Norris-Landzberg model for lead-free solder joint low-cycle fatigue, by using the general log-linear (GLL) model in ALTA PRO. Read more

Read the Latest Reliability News 

Introducing HBM Prenscia — a New Platform to Unite ReliaSoft and nCode

The creation of HBM Prenscia, a new strategic segment of HBM, was announced this month. HBMPrenscia leverages nCode and ReliaSoft products to deliver solutions in the disciplines of durability, data analysis and reliability. Prenscia Access, a new token-based licensing system, allows unprecedented use of all nCode and ReliaSoft desktop applications across the organization, depending on available tokens. Empower your organisation by streamlining your engineering processes. Visit www.hbmprenscia.com for more information.

Tesla Motors Announced as Keynote Speaker at ARS North America

Later this month, you won’t want to miss the Applied Reliability Symposium in San Diego, California.Georgios Sarakakis, Senior Manager of Reliability Engineering for Tesla Motors, will speak on The First Two Billion All-Electric Miles: Enabling Reliability of Disruptive Technologies for the Keynote Address. The ARS event runs from June 21 – 23 and features 30 results-oriented presentations, 4 expert tutorials and plenty of networking opportunities. To register, visit:http://www.ARSymposium.org/register.htm.

Register Today to Save – 2016 ARS India

Make your plans to attend the International Applied Reliability Symposium (ARS) India from August 10 – 12 in Bangalore. Register now until July 15th to receive a discount. This year’s symposium offers 28 presentations and 1 group session. View the program here:http://www.ARSymposium.org/india/2016/2016in_matrix.htm.

Learn more about how you and your organization can benefit from attending by visiting:http://www.ARSymposium.org/india/whyattend.htm.

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